Franco Stellari, Peilin Song, John Sylvestri, D. Miles, Orazio P. Forlenza, Donato O. Forlenza. On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC). In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]
@inproceedings{StellariSSMFF09,
title = {On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC)},
author = {Franco Stellari and Peilin Song and John Sylvestri and D. Miles and Orazio P. Forlenza and Donato O. Forlenza},
year = {2009},
doi = {10.1109/TEST.2009.5355543},
url = {http://dx.doi.org/10.1109/TEST.2009.5355543},
researchr = {https://researchr.org/publication/StellariSSMFF09},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009},
editor = {Gordon W. Roberts and Bill Eklow},
publisher = {IEEE},
isbn = {978-1-4244-4868-5},
}