The following publications are possibly variants of this publication:
- Characterization of a 0.13 mum CMOS Link Chip using Time Resolved Emission (TRE)Franco Stellari, Peilin Song, John Hryckowian, Otto A. Torreiter, Steve Wilson, Philip Wu, Alberto Tosi. mr, 45(9-11):1550-1553, 2005. [doi]
- A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage CurrentPeilin Song, Franco Stellari, Alan J. Weger, Tian Xia. itc 2003: 140-147 [doi]
- Functional block extraction for hardware security detection using time-integrated and time-resolved emission measurementsFranco Stellari, Peilin Song, Herschel A. Ainspan. vts 2014: 1-6 [doi]
- Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurementsFranco Stellari, Keith A. Jenkins, Alan J. Weger, Barry P. Linder, Peilin Song. irps 2015: 2 [doi]