Stuck Fault and Current Testing Comparison Using CMOS Chip Test - researchr publication authors

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Thomas M. Storey, Wojciech Maly, John Andrews, Myron Miske. Stuck Fault and Current Testing Comparison Using CMOS Chip Test. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 311-318, IEEE Computer Society, 1991.

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