Thomas M. Storey, Wojciech Maly, John Andrews, Myron Miske. Stuck Fault and Current Testing Comparison Using CMOS Chip Test. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 311-318, IEEE Computer Society, 1991.
@inproceedings{StoreyMAM91,
title = {Stuck Fault and Current Testing Comparison Using CMOS Chip Test},
author = {Thomas M. Storey and Wojciech Maly and John Andrews and Myron Miske},
year = {1991},
tags = {testing},
researchr = {https://researchr.org/publication/StoreyMAM91},
cites = {0},
citedby = {0},
pages = {311-318},
booktitle = {Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
publisher = {IEEE Computer Society},
isbn = {0-8186-9156-5},
}