Thomas M. Storey, Wojciech Maly, John Andrews, Myron Miske. Stuck Fault and Current Testing Comparison Using CMOS Chip Test. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 311-318, IEEE Computer Society, 1991.
Abstract is missing.