A novel LCD driver testing technique using logic test channels - researchr publication authors

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Chauchin Su, Wei-Juo Wang, Chih-hu Wang, I. S. Tseng. A novel LCD driver testing technique using logic test channels. In Hiroto Yasuura, editor, Proceedings of the 2003 Asia and South Pacific Design Automation Conference, ASP-DAC '03, Kitakyushu, Japan, January 21-24, 2003. pages 657-662, ACM, 2003. [doi]

This author has not been identified. Look up 'Chauchin Su' in GoogleThis author has not been identified. Look up 'Wei-Juo Wang' in GoogleThis author has not been identified. Look up 'Chih-hu Wang' in GoogleThis author has not been identified. Look up 'I. S. Tseng' in Google

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