Chauchin Su, Wei-Juo Wang, Chih-hu Wang, I. S. Tseng. A novel LCD driver testing technique using logic test channels. In Hiroto Yasuura, editor, Proceedings of the 2003 Asia and South Pacific Design Automation Conference, ASP-DAC '03, Kitakyushu, Japan, January 21-24, 2003. pages 657-662, ACM, 2003. [doi]
Abstract is missing.