Chauchin Su, Wei-Juo Wang, Chih-hu Wang, I. S. Tseng. A novel LCD driver testing technique using logic test channels. In Hiroto Yasuura, editor, Proceedings of the 2003 Asia and South Pacific Design Automation Conference, ASP-DAC '03, Kitakyushu, Japan, January 21-24, 2003. pages 657-662, ACM, 2003. [doi]
@inproceedings{SuWWT03-0,
title = {A novel LCD driver testing technique using logic test channels},
author = {Chauchin Su and Wei-Juo Wang and Chih-hu Wang and I. S. Tseng},
year = {2003},
doi = {10.1145/1119772.1119920},
url = {http://doi.acm.org/10.1145/1119772.1119920},
researchr = {https://researchr.org/publication/SuWWT03-0},
cites = {0},
citedby = {0},
pages = {657-662},
booktitle = {Proceedings of the 2003 Asia and South Pacific Design Automation Conference, ASP-DAC '03, Kitakyushu, Japan, January 21-24, 2003},
editor = {Hiroto Yasuura},
publisher = {ACM},
isbn = {0-7803-7660-9},
}