Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Etienne Auvray. On the Generation of Diagnostic Test Set for Intra-cell Defects. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 312-317, IEEE Computer Society, 2014. [doi]
Abstract is missing.