Voltage-based electromigration immortality check for general multi-branch interconnects - researchr publication authors

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Zeyu Sun, Ertugrul Demircan, Mehul D. Shrof, Taeyoung Kim, Xin Huang, Sheldon X.-D. Tan. Voltage-based electromigration immortality check for general multi-branch interconnects. In Frank Liu, editor, Proceedings of the 35th International Conference on Computer-Aided Design, ICCAD 2016, Austin, TX, USA, November 7-10, 2016. pages 113, ACM, 2016. [doi]

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