Zeyu Sun, Ertugrul Demircan, Mehul D. Shrof, Taeyoung Kim, Xin Huang, Sheldon X.-D. Tan. Voltage-based electromigration immortality check for general multi-branch interconnects. In Frank Liu, editor, Proceedings of the 35th International Conference on Computer-Aided Design, ICCAD 2016, Austin, TX, USA, November 7-10, 2016. pages 113, ACM, 2016. [doi]
@inproceedings{SunDSKHT16,
title = {Voltage-based electromigration immortality check for general multi-branch interconnects},
author = {Zeyu Sun and Ertugrul Demircan and Mehul D. Shrof and Taeyoung Kim and Xin Huang and Sheldon X.-D. Tan},
year = {2016},
doi = {10.1145/2966986.2967083},
url = {http://doi.acm.org/10.1145/2966986.2967083},
researchr = {https://researchr.org/publication/SunDSKHT16},
cites = {0},
citedby = {0},
pages = {113},
booktitle = {Proceedings of the 35th International Conference on Computer-Aided Design, ICCAD 2016, Austin, TX, USA, November 7-10, 2016},
editor = {Frank Liu},
publisher = {ACM},
isbn = {978-1-4503-4466-1},
}