The following publications are possibly variants of this publication:
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- Finite difference method for electromigration analysis of multi-branch interconnectsChase Cook, Zeyu Sun, Taeyoung Kim 0001, Sheldon X.-D. Tan. smacd 2016: 1-4 [doi]
- Fast Analytic Electromigration Analysis for General Multisegment Interconnect WiresLiang Chen, Sheldon X.-D. Tan, Zeyu Sun, Shaoyi Peng, Min Tang, Junfa Mao. tvlsi, 28(2):421-432, 2020. [doi]