Contactless digital testing of IC pin leakage currents - researchr publication related

researchr

You are not signed in
Sign in
Sign up

Stephen K. Sunter, Charles McDonald, Givargis Danialy. Contactless digital testing of IC pin leakage currents. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 204-210, IEEE Computer Society, 2001.

The following publications are possibly variants of this publication:

Contactless Test of IC Pads, Pins, and TSVs via Standard Boundary ScanS. Sunter, A. Roy. dt, 29(5):55-62, 2012. [doi]

Complete, Contactless I/O Testing - Reaching the Boundary in Minimizing Digital IC Testing CostStephen K. Sunter, Benoit Nadeau-Dostie. itc 2002: 446-455 [doi]

runs on WebDSL