A/MS benchmark circuits for comparing fault simulation, DFT, and test generation methods - researchr publication

researchr

You are not signed in
Sign in
Sign up

Stephen Sunter, Peter Sarson. A/MS benchmark circuits for comparing fault simulation, DFT, and test generation methods. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-7, IEEE, 2017. [doi]

Abstract is missing.

runs on WebDSL