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Vikram B. Suresh, Sandip Kundu. On analyzing and mitigating SRAM BER due to random thermal noise. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2013, Natal, Brazil, August 5-7, 2013. pages 159-164, IEEE, 2013. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Managing test coverage uncertainty due to thermal noise in nano-CMOS: A case-study on an SRAM arrayVikram B. Suresh, Sandip Kundu. iccd 2013: 201-206 [doi] Managing Test Coverage Uncertainty due to Random Noise in Nano-CMOS: A Case-Study on an SRAM ArrayVikram B. Suresh, Sandip Kundu. tcad, 35(1):155-165, 2016. [doi]
The following publications are possibly variants of this publication: