A Method to Detect Bit Flips in a Soft-Error Resilient TCAM

Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen. A Method to Detect Bit Flips in a Soft-Error Resilient TCAM. IEEE Trans. on CAD of Integrated Circuits and Systems, 37(6):1185-1196, 2018. [doi]

Authors

Infall Syafalni

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Tsutomu Sasao

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Xiaoqing Wen

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