A Method to Detect Bit Flips in a Soft-Error Resilient TCAM

Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen. A Method to Detect Bit Flips in a Soft-Error Resilient TCAM. IEEE Trans. on CAD of Integrated Circuits and Systems, 37(6):1185-1196, 2018. [doi]

Abstract

Abstract is missing.