Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen. A Method to Detect Bit Flips in a Soft-Error Resilient TCAM. IEEE Trans. on CAD of Integrated Circuits and Systems, 37(6):1185-1196, 2018. [doi]
@article{SyafalniSW18,
title = {A Method to Detect Bit Flips in a Soft-Error Resilient TCAM},
author = {Infall Syafalni and Tsutomu Sasao and Xiaoqing Wen},
year = {2018},
doi = {10.1109/TCAD.2017.2748019},
url = {https://doi.org/10.1109/TCAD.2017.2748019},
researchr = {https://researchr.org/publication/SyafalniSW18},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {37},
number = {6},
pages = {1185-1196},
}