Extended Forward Implications and Dual Recurrence Relations to Identify Sequentially Untestable Faults

Manan Syal, Rajat Arora, Michael S. Hsiao. Extended Forward Implications and Dual Recurrence Relations to Identify Sequentially Untestable Faults. In 23rd International Conference on Computer Design (ICCD 2005), 2-5 October 2005, San Jose, CA, USA. pages 453-460, IEEE Computer Society, 2005. [doi]

Authors

Manan Syal

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Rajat Arora

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Michael S. Hsiao

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