Manan Syal, Rajat Arora, Michael S. Hsiao. Extended Forward Implications and Dual Recurrence Relations to Identify Sequentially Untestable Faults. In 23rd International Conference on Computer Design (ICCD 2005), 2-5 October 2005, San Jose, CA, USA. pages 453-460, IEEE Computer Society, 2005. [doi]
Abstract is missing.