Extended Forward Implications and Dual Recurrence Relations to Identify Sequentially Untestable Faults - researchr publication related

researchr

You are not signed in
Sign in
Sign up

Manan Syal, Rajat Arora, Michael S. Hsiao. Extended Forward Implications and Dual Recurrence Relations to Identify Sequentially Untestable Faults. In 23rd International Conference on Computer Design (ICCD 2005), 2-5 October 2005, San Jose, CA, USA. pages 453-460, IEEE Computer Society, 2005. [doi]

The following publications are possibly variants of this publication:

Efficient Implication - Based Untestable Bridge Fault IdentifierManan Syal, Michael S. Hsiao, Kiran B. Doreswamy, Sreejit Chakravarty. vts 2003: 393-402 [doi]

Untestable Fault Identification using Recurrence Relations and Impossible Value AssignmentsManan Syal, Michael S. Hsiao. vlsid 2004: 481-486 [doi]

On identifying functionally untestable transition faultsXiao Liu, Michael S. Hsiao. hldvt 2004: 121-126 [doi]

runs on WebDSL