Soft error tolerant latch designs with low power consumption (invited paper) - researchr publication authors

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Saki Tajima, Nozomu Togawa, Masao Yanagisawa, Youhua Shi. Soft error tolerant latch designs with low power consumption (invited paper). In Yajie Qin, Zhiliang Hong, Ting-Ao Tang, editors, 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017. pages 52-55, IEEE, 2017. [doi]

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