Soft error tolerant latch designs with low power consumption (invited paper)

Saki Tajima, Nozomu Togawa, Masao Yanagisawa, Youhua Shi. Soft error tolerant latch designs with low power consumption (invited paper). In Yajie Qin, Zhiliang Hong, Ting-Ao Tang, editors, 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017. pages 52-55, IEEE, 2017. [doi]

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