Saki Tajima, Nozomu Togawa, Masao Yanagisawa, Youhua Shi. Soft error tolerant latch designs with low power consumption (invited paper). In Yajie Qin, Zhiliang Hong, Ting-Ao Tang, editors, 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017. pages 52-55, IEEE, 2017. [doi]
Abstract is missing.