Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Toshiyuki Matsunaga. A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational Circuits. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 320-325, IEEE Computer Society, 1997. [doi]
@inproceedings{TakahashiBTM97,
title = {A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational Circuits},
author = {Hiroshi Takahashi and Kwame Osei Boateng and Yuzo Takamatsu and Toshiyuki Matsunaga},
year = {1997},
url = {http://csdl.computer.org/comp/proceedings/ats/1997/8209/00/82090320abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/TakahashiBTM97},
cites = {0},
citedby = {0},
pages = {320-325},
booktitle = {6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan},
publisher = {IEEE Computer Society},
isbn = {0-8186-8209-4},
}