Hiroshi Takahashi, Yoshinobu Higami, Shuhei Kadoyama, Takashi Aikyo, Yuzo Takamatsu, Koji Yamazaki, Toshiyuki Tsutsumi, Hiroyuki Yotsuyanagi, Masaki Hashizume. Clues for Modeling and Diagnosing Open Faults with Considering Adjacent Lines. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 39-44, IEEE, 2007. [doi]
Abstract is missing.