The following publications are possibly variants of this publication:
- New Class of Tests for Open Faults with Considering Adjacent LinesHiroshi Takahashi, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Toshiyuki Tsutsumi, Hiroyuki Yotsuyanagi, Masaki Hashizume. ats 2009: 301-306 [doi]
- Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent LinesHiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume. dft 2007: 243-251 [doi]
- Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm ICHiroyuki Yotsuyanagi, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu. vlsid 2009: 91-96 [doi]
- SAT-Based Test Generation for Open Faults Using Fault Excitation Caused by Effect of Adjacent LinesJun Yamashita, Hiroyuki Yotsuyanagi, Masaki Hashizume, Kozo Kinoshita. ieicet, 96-A(12):2561-2567, 2013. [doi]
- On selection of adjacent lines in test pattern generation for delay faults considering crosstalk effectsYuuya Ohama, Hiroyuki Yotsuyanagi, Masaki Hashizume, Yoshinobu Higami, Hiroshi Takahashi. iscit 2017: 1-5 [doi]