R. Tamura, I. Mori, N. Watanabe, Hiroki Koike, Tetsuo Endoh. Accurate error bit mode analysis of STT-MRAM chip with a novel current measurement module implemented to gigabit class memory test system. In Non-Volatile Memory Technology Symposium, NVMTS 2018, Sendai, Japan, October 22-24, 2018. pages 1-5, IEEE, 2018. [doi]
Abstract is missing.