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Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited)

Sheldon X.-D. Tan, Hussam Amrouch, Taeyoung Kim, Zeyu Sun, Chase Cook, Jörg Henkel. Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited). Integration, 60:132-152, 2018. [doi]

Authors

Sheldon X.-D. Tan

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Hussam Amrouch

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Taeyoung Kim

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Zeyu Sun

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Chase Cook

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Jörg Henkel

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