Sheldon X.-D. Tan, Hussam Amrouch, Taeyoung Kim, Zeyu Sun, Chase Cook, Jörg Henkel. Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited). Integration, 60:132-152, 2018. [doi]
@article{TanAKSCH18,
title = {Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited)},
author = {Sheldon X.-D. Tan and Hussam Amrouch and Taeyoung Kim and Zeyu Sun and Chase Cook and Jörg Henkel},
year = {2018},
doi = {10.1016/j.vlsi.2017.08.009},
url = {https://doi.org/10.1016/j.vlsi.2017.08.009},
researchr = {https://researchr.org/publication/TanAKSCH18},
cites = {0},
citedby = {0},
journal = {Integration},
volume = {60},
pages = {132-152},
}