Reliability-constrained area optimization of VLSI power/ground networks via sequence of linear programmings

Sheldon X.-D. Tan, C.-J. Richard Shi, Jyh-Chwen Lee. Reliability-constrained area optimization of VLSI power/ground networks via sequence of linear programmings. IEEE Trans. on CAD of Integrated Circuits and Systems, 22(12):1678-1684, 2003. [doi]

Authors

Sheldon X.-D. Tan

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C.-J. Richard Shi

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Jyh-Chwen Lee

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