Sheldon X.-D. Tan, C.-J. Richard Shi, Jyh-Chwen Lee. Reliability-constrained area optimization of VLSI power/ground networks via sequence of linear programmings. IEEE Trans. on CAD of Integrated Circuits and Systems, 22(12):1678-1684, 2003. [doi]
@article{TanSL03,
title = {Reliability-constrained area optimization of VLSI power/ground networks via sequence of linear programmings},
author = {Sheldon X.-D. Tan and C.-J. Richard Shi and Jyh-Chwen Lee},
year = {2003},
doi = {10.1109/TCAD.2003.819429},
url = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2003.819429},
tags = {optimization, C++, program optimization, reliability},
researchr = {https://researchr.org/publication/TanSL03},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {22},
number = {12},
pages = {1678-1684},
}