Diagnosing timing related cell internal defects for FinFET technology - researchr publication authors

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Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke. Diagnosing timing related cell internal defects for FinFET technology. In VLSI Design, Automation and Test, VLSI-DAT 2015, Hsinchu, Taiwan, April 27-29, 2015. pages 1-4, IEEE, 2015. [doi]

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