Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke. Diagnosing timing related cell internal defects for FinFET technology. In VLSI Design, Automation and Test, VLSI-DAT 2015, Hsinchu, Taiwan, April 27-29, 2015. pages 1-4, IEEE, 2015. [doi]
@inproceedings{TangTCBH15,
title = {Diagnosing timing related cell internal defects for FinFET technology},
author = {Huaxing Tang and Ting-Pu Tai and Wu-Tung Cheng and Brady Benware and Friedrich Hapke},
year = {2015},
doi = {10.1109/VLSI-DAT.2015.7114547},
url = {http://dx.doi.org/10.1109/VLSI-DAT.2015.7114547},
researchr = {https://researchr.org/publication/TangTCBH15},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {VLSI Design, Automation and Test, VLSI-DAT 2015, Hsinchu, Taiwan, April 27-29, 2015},
publisher = {IEEE},
isbn = {978-1-4799-6275-4},
}