Diagnosing timing related cell internal defects for FinFET technology

Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke. Diagnosing timing related cell internal defects for FinFET technology. In VLSI Design, Automation and Test, VLSI-DAT 2015, Hsinchu, Taiwan, April 27-29, 2015. pages 1-4, IEEE, 2015. [doi]

Abstract

Abstract is missing.