X-masking during logic BIST and its impact on defect coverage - researchr publication authors

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Yuyi Tang, Hans-Joachim Wunderlich, Piet Engelke, Ilia Polian, Bernd Becker, Jürgen Schlöffel, Friedrich Hapke, Michael Wittke. X-masking during logic BIST and its impact on defect coverage. IEEE Trans. VLSI Syst., 14(2):193-202, 2006. [doi]

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