The following publications are possibly variants of this publication:
- X-Masking During Logic BIST and Its Impact on Defect CoverageYuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker. itc 2003: 442-451 [doi]
- High Defect Coverage with Low-Power Test Sequences in a BIST EnvironmentPatrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Hans-Joachim Wunderlich. dt, 19(5):44-52, 2002. [doi]