Yuyi Tang, Hans-Joachim Wunderlich, Piet Engelke, Ilia Polian, Bernd Becker, Jürgen Schlöffel, Friedrich Hapke, Michael Wittke. X-masking during logic BIST and its impact on defect coverage. IEEE Trans. VLSI Syst., 14(2):193-202, 2006. [doi]
@article{TangWEPBSHW06,
title = {X-masking during logic BIST and its impact on defect coverage},
author = {Yuyi Tang and Hans-Joachim Wunderlich and Piet Engelke and Ilia Polian and Bernd Becker and Jürgen Schlöffel and Friedrich Hapke and Michael Wittke},
year = {2006},
doi = {10.1109/TVLSI.2005.863742},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2005.863742},
tags = {logic, coverage},
researchr = {https://researchr.org/publication/TangWEPBSHW06},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {14},
number = {2},
pages = {193-202},
}