Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Mottaqiallah Taouil, Said Hamdioui, Kees Beenakker, Erik Jan Marinissen. Test Impact on the Overall Die-to-Wafer 3D Stacked IC Cost. J. Electronic Testing, 28(1):15-25, 2012. [doi]