Heuristic Prediction of the Optimum Number of spares in Defect-Tolerant Integrated Circuits

Claude Thibeault, Yvon Savaria, Jean-Louis Houle. Heuristic Prediction of the Optimum Number of spares in Defect-Tolerant Integrated Circuits. Journal of Circuits, Systems, and Computers, 2(2):81-100, 1992. [doi]

Authors

Claude Thibeault

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Yvon Savaria

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Jean-Louis Houle

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