Heuristic Prediction of the Optimum Number of spares in Defect-Tolerant Integrated Circuits

Claude Thibeault, Yvon Savaria, Jean-Louis Houle. Heuristic Prediction of the Optimum Number of spares in Defect-Tolerant Integrated Circuits. Journal of Circuits, Systems, and Computers, 2(2):81-100, 1992. [doi]

@article{ThibeaultSH92-0,
  title = {Heuristic Prediction of the Optimum Number of spares in Defect-Tolerant Integrated Circuits},
  author = {Claude Thibeault and Yvon Savaria and Jean-Louis Houle},
  year = {1992},
  doi = {10.1142/S0218126692000088},
  url = {http://dx.doi.org/10.1142/S0218126692000088},
  researchr = {https://researchr.org/publication/ThibeaultSH92-0},
  cites = {0},
  citedby = {0},
  journal = {Journal of Circuits, Systems, and Computers},
  volume = {2},
  number = {2},
  pages = {81-100},
}