Heuristic Prediction of the Optimum Number of spares in Defect-Tolerant Integrated Circuits

Claude Thibeault, Yvon Savaria, Jean-Louis Houle. Heuristic Prediction of the Optimum Number of spares in Defect-Tolerant Integrated Circuits. Journal of Circuits, Systems, and Computers, 2(2):81-100, 1992. [doi]

Abstract

Abstract is missing.