Simon Thomann, Chao Li, Cheng Zhuo, Om Prakash 0007, Xunzhao Yin, Xiaobo Sharon Hu, Hussam Amrouch. On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM. In 39th IEEE VLSI Test Symposium, VTS 2021, San Diego, CA, USA, April 25-28, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.