Structural Defects and Degradation Phenomena in High-Power Pure-Blue InGaN-Based Laser Diodes

Shigetaka Tomiya, Osamu Goto, Masao Ikeda. Structural Defects and Degradation Phenomena in High-Power Pure-Blue InGaN-Based Laser Diodes. Proceedings of the IEEE, 98(7):1208-1213, 2010. [doi]

Authors

Shigetaka Tomiya

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Osamu Goto

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Masao Ikeda

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