Shigetaka Tomiya, Osamu Goto, Masao Ikeda. Structural Defects and Degradation Phenomena in High-Power Pure-Blue InGaN-Based Laser Diodes. Proceedings of the IEEE, 98(7):1208-1213, 2010. [doi]
@article{TomiyaGI10,
title = {Structural Defects and Degradation Phenomena in High-Power Pure-Blue InGaN-Based Laser Diodes},
author = {Shigetaka Tomiya and Osamu Goto and Masao Ikeda},
year = {2010},
doi = {10.1109/JPROC.2009.2032306},
url = {http://dx.doi.org/10.1109/JPROC.2009.2032306},
researchr = {https://researchr.org/publication/TomiyaGI10},
cites = {0},
citedby = {0},
journal = {Proceedings of the IEEE},
volume = {98},
number = {7},
pages = {1208-1213},
}