Structural Defects and Degradation Phenomena in High-Power Pure-Blue InGaN-Based Laser Diodes

Shigetaka Tomiya, Osamu Goto, Masao Ikeda. Structural Defects and Degradation Phenomena in High-Power Pure-Blue InGaN-Based Laser Diodes. Proceedings of the IEEE, 98(7):1208-1213, 2010. [doi]

Abstract

Abstract is missing.