A. Toulouse, David Bernard, Christian Landrault, Pascal Nouet. Efficient 3D Modelling for Extraction of Interconnect Capacitances in Deep Submicron Dense Layouts. In 1999 Design, Automation and Test in Europe (DATE 99), 9-12 March 1999, Munich, Germany. pages 576-580, IEEE Computer Society, 1999. [doi]
@inproceedings{ToulouseBLN99,
title = {Efficient 3D Modelling for Extraction of Interconnect Capacitances in Deep Submicron Dense Layouts},
author = {A. Toulouse and David Bernard and Christian Landrault and Pascal Nouet},
year = {1999},
url = {http://csdl.computer.org/comp/proceedings/date/1999/0078/00/00780576abs.htm},
tags = {layout, Pascal},
researchr = {https://researchr.org/publication/ToulouseBLN99},
cites = {0},
citedby = {0},
pages = {576-580},
booktitle = {1999 Design, Automation and Test in Europe (DATE 99), 9-12 March 1999, Munich, Germany},
publisher = {IEEE Computer Society},
isbn = {0-7695-0078-1},
}