Maximizing Yield for Approximate Integrated Circuits

Marcello Traiola, Arnaud Virazel, Patrick Girard 0001, Mario Barbareschi, Alberto Bosio. Maximizing Yield for Approximate Integrated Circuits. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 810-815, IEEE, 2020. [doi]

Abstract

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