A Survey of Testing Techniques for Approximate Integrated Circuits - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Marcello Traiola, Arnaud Virazel, Patrick Girard 0001, Mario Barbareschi, Alberto Bosio. A Survey of Testing Techniques for Approximate Integrated Circuits. Proceedings of the IEEE, 108(12):2178-2194, 2020. [doi]

This author has not been identified. Look up 'Marcello Traiola' in GoogleThis author has not been identified. Look up 'Arnaud Virazel' in GoogleThis author has not been identified. Look up 'Patrick Girard 0001' in GoogleThis author has not been identified. Look up 'Mario Barbareschi' in GoogleThis author has not been identified. Look up 'Alberto Bosio' in Google

runs on WebDSL