Marcello Traiola, Arnaud Virazel, Patrick Girard 0001, Mario Barbareschi, Alberto Bosio. A Survey of Testing Techniques for Approximate Integrated Circuits. Proceedings of the IEEE, 108(12):2178-2194, 2020. [doi]
@article{TraiolaVGBB20,
title = {A Survey of Testing Techniques for Approximate Integrated Circuits},
author = {Marcello Traiola and Arnaud Virazel and Patrick Girard 0001 and Mario Barbareschi and Alberto Bosio},
year = {2020},
doi = {10.1109/JPROC.2020.2999613},
url = {https://doi.org/10.1109/JPROC.2020.2999613},
researchr = {https://researchr.org/publication/TraiolaVGBB20},
cites = {0},
citedby = {0},
journal = {Proceedings of the IEEE},
volume = {108},
number = {12},
pages = {2178-2194},
}